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Patent Analysis×Technology Delphi×
المجالScience Technology StudiesScience Technology Studies
العائلةProcess / pipelineProcess / pipeline
سنة النشأة19941975
صاحب الطريقةFrancis Narin (patent bibliometrics) and the patent-analytics communityHelmer & Dalkey (RAND); national applications by NISTEP (Japan) and Cuhls (Germany)
النوعDocument-based technological-intelligence processIterative structured expert-survey process
المصدر التأسيسيNarin, F. (1994). Patent bibliometrics. Scientometrics, 30(1), 147-155. DOI ↗Linstone, H. A., & Turoff, M. (Eds.). (1975). The Delphi Method: Techniques and Applications. Addison-Wesley. ISBN: 9780201042948
الأسماء البديلةPatent analytics, Patent bibliometrics, Patent landscapingTechnology Delphi survey, Foresight Delphi, National Delphi forecast
ذات صلة44
الملخصPatent analysis, or patanalytics, mines the documents and metadata in patent databases to generate technological intelligence. Because patents are structured, dated, classified, and citation-linked records of inventive activity, analysing patent counts, citations, classification codes, applicants, and text reveals who is innovating where, in which technologies, how fields connect, and how the technological landscape is shifting—evidence that feeds competitive intelligence, R&D strategy, and foresight.The technology Delphi is a large-scale, multi-round expert survey used to forecast the timing, importance, and feasibility of future technological developments. Built on the classic Delphi principles of anonymity, iteration, controlled feedback, and statistical aggregation, it elicits judgements from hundreds or thousands of experts on a structured list of technology statements and converges them, round by round, into a collective forecast that informs national and organisational science and technology priorities.
ScholarGateمجموعة البيانات
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ScholarGateقارن الطرق: Patent Analysis · Technology Delphi. استُرجع بتاريخ 2026-06-25 من https://scholargate.app/ar/compare