X-Ray Fluorescence Sourcing
X-ray fluorescence (XRF) sourcing identifies where an artifact's raw material came from by measuring its elemental composition. When a sample is irradiated with high-energy X-rays, each element emits secondary X-rays at characteristic energies, and the intensities of these emissions reveal how much of each element is present. Because volcanic glass, clays, and ores from different geological sources carry distinct trace-element signatures, comparing an artifact's composition to a library of source samples can assign it to its origin. As the geoarchaeology volume edited by M. Steven Shackley documents, XRF — including rapid, non-destructive portable instruments (pXRF) — has become a workhorse for sourcing obsidian, and is also applied to ceramics, metals, and other materials. The resulting provenance data drive reconstructions of procurement and exchange.
Rekodi ya chanzo
Nukuu zimehamishwa kwa uhalisi kutoka kwa rekodi ya chanzo cha mbinu. Hakuna uthibitisho wa kiwango cha dai unaodokezwa kutoka kwao.
- Shackley, M. S. (Ed.). (2011). X-Ray Fluorescence Spectrometry (XRF) in Geoarchaeology. Springer. · DOI 10.1007/978-1-4419-6886-9
- Renfrew, C., & Bahn, P. (2016). Archaeology: Theories, Methods, and Practice (7th ed.). Thames & Hudson. · ISBN 9780500292105
Madai yaliyotunzwa
Madai yamehifadhiwa katika daftari la ushahidi, kila moja ikiwa na tathmini yake.
Mwonekano huu haubuni tathmini ya dai wakati daftari haina yoyote.
Mbinu zinazohusiana
Zilizotengenezwa kutoka kwa grafu ya mbinu na kuonyeshwa kama uhusiano uliopendekezwa na mashine — hakuna dai la ushahidi linalodokezwa.