Attributes Control Chart
Attributes control charts extend Shewhart's framework to count and proportion data — quality characteristics that are classified rather than measured. The p- and np-charts monitor the proportion or number of defective items using the binomial distribution, while the c- and u-charts monitor the number of defects per unit using the Poisson distribution. They are the standard statistical-process-control tools when inspection yields pass/fail or defect counts rather than continuous measurements.
Rekodi ya chanzo
Nukuu zimehamishwa kwa uhalisi kutoka kwa rekodi ya chanzo cha mbinu. Hakuna uthibitisho wa kiwango cha dai unaodokezwa kutoka kwao.
- Shewhart, W. A. (1931). Economic Control of Quality of Manufactured Product. D. Van Nostrand Company. · ISBN 978-0-87389-076-2
- Montgomery, D. C. (2009). Introduction to Statistical Quality Control (6th ed.). John Wiley & Sons. · ISBN 978-0-470-16992-6
Madai yaliyotunzwa
Madai yamehifadhiwa katika daftari la ushahidi, kila moja ikiwa na tathmini yake.
Mwonekano huu haubuni tathmini ya dai wakati daftari haina yoyote.
Mbinu zinazohusiana
Zilizotengenezwa kutoka kwa grafu ya mbinu na kuonyeshwa kama uhusiano uliopendekezwa na mashine — hakuna dai la ushahidi linalodokezwa.