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| Z-scan× | Μέθοδος Διάδοσης Δέσμης× | |
|---|---|---|
| Πεδίο | Οπτική | Οπτική |
| Οικογένεια | Process / pipeline | Process / pipeline |
| Έτος προέλευσης≠ | 1990 | 1978 |
| Δημιουργός≠ | Mansoor Sheik-Bahae, David Hagan, and Eric Van Stryland | Michael Feit and John Fleck |
| Τύπος≠ | Measurement technique | Paraxial propagation algorithm |
| Θεμελιώδης πηγή≠ | Sheik-Bahae, M., Said, A. A., Wei, T. H., Hagan, D. J., & Van Stryland, E. W. (1990). Sensitive measurement of optical nonlinearities using a single beam. IEEE Journal of Quantum Electronics, 26(4), 760-769. DOI ↗ | Feit, M. D., & Fleck, J. A. (1978). Light propagation in graded-index optical fibers. Applied Optics, 17(24), 3990-3998. DOI ↗ |
| Εναλλακτικές ονομασίες | Z-scan method, nonlinear refraction measurement | BPM, paraxial approximation method |
| Συναφείς | 3 | 3 |
| Σύνοψη≠ | The Z-scan technique is an experimental method for measuring nonlinear optical properties of materials, particularly third-order susceptibility and nonlinear absorption. Developed by Sheik-Bahae, Hagan, and Van Stryland in 1990, Z-scan uses a tightly focused laser beam and moves the sample along the beam propagation axis (z-axis), recording transmission variation to deduce nonlinear refraction and absorption coefficients with high sensitivity. | The Beam Propagation Method is a computational technique for simulating the propagation of optical beams through slowly varying, weakly guiding structures. Developed by Feit and Fleck in 1978, BPM exploits the paraxial approximation to reduce the full vector wave equation to a scalar or vector envelope equation, enabling efficient simulation of waveguides, integrated optics, and photonic devices. |
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