Σύγκριση μεθόδων

	SIBTEST	Μοντέλο DINO
Πεδίο	Ψυχομετρία	Ψυχομετρία
Οικογένεια	Latent structure	Latent structure
Έτος προέλευσης	1993	2006
Δημιουργός	Richard Shealy, William F. Stout	James Templin, Russell Henson
Τύπος	Differential item functioning (DIF) assessment	Disjunctive latent class model
Θεμελιώδης πηγή	Shealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194.	Templin, J., & Henson, R. A. (2006). Measurement of psychological disorders using cognitive diagnosis models. Psychological Methods, 11(3), 287-305.
Εναλλακτικές ονομασίες	—	DINO
Συναφείς	5	4
Σύνοψη	SIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.	The DINO Model (Deterministic Inputs, Noisy Outputs—Disjunctive) is a cognitive diagnostic model that relaxes DINA's conjunctive (AND) skill requirement logic. DINO assumes an examinee only needs to master one of multiple possible skill pathways to answer an item correctly, making it suitable for scenarios where skills are substitutable or alternative routes to success exist.