Σύγκριση μεθόδων

	Δοκιμή μοναδιαίας ρίζας πάνελ Im-Pesaran-Shin (IPS)	PANIC Test: Ανάλυση Μοναδιαίας Ρίζας σε Πάνελ με Αποσύνθεση Κοινών Παραγόντων
Πεδίο	Οικονομετρία	Οικονομετρία
Οικογένεια	Hypothesis test	Hypothesis test
Έτος προέλευσης	2003	2004
Δημιουργός	Im, Pesaran & Shin	Jushan Bai & Serena Ng
Τύπος	Panel unit-root test allowing cross-sectional heterogeneity	Panel unit root test
Θεμελιώδης πηγή	Im, K. S., Pesaran, M. H., & Shin, Y. (2003). Testing for unit roots in heterogeneous panels. Journal of Econometrics, 115(1), 53–74.	Bai, J., & Ng, S. (2004). A PANIC attack on unit roots and cointegration. Econometrica, 72(4), 1127–1177.
Εναλλακτικές ονομασίες	IPS Test, IPS Panel Unit-Root Test, Heterogeneous Panel Unit-Root Test, Im-Pesaran-Shin Birim Kök Testi	Panel Analysis of Non-stationarity in Idiosyncratic and Common Components, Bai-Ng PANIC Test, Second-Generation Panel Unit Root Test, Panel Birim Kök Testi (PANIC)
Συναφείς	3	3
Σύνοψη	The Im-Pesaran-Shin (IPS) test, introduced by Im, Pesaran, and Shin in 2003, is a panel unit-root test designed for heterogeneous panels where the autoregressive coefficient is allowed to differ across cross-sectional units. It averages individual Augmented Dickey-Fuller (ADF) t-statistics and constructs a standardized statistic with a standard normal limiting distribution, making it one of the most widely applied first-generation panel unit-root tests in applied econometrics.	PANIC (Panel Analysis of Non-stationarity in Idiosyncratic and Common Components) is a second-generation panel unit root test introduced by Bai and Ng (2004). It decomposes each panel series into common factors and idiosyncratic components, then tests for unit roots in each part separately, making it robust to cross-sectional dependence — a critical limitation of first-generation tests such as IPS or LLC.