Σύγκριση μεθόδων

	ATR-FTIR	EXAFS
Πεδίο	Φασματοσκοπία	Φασματοσκοπία
Οικογένεια	Process / pipeline	Process / pipeline
Έτος προέλευσης	1961	1971
Δημιουργός	Joop Fahrenfort	Edward Stern
Τύπος	Vibrational spectroscopy technique	Synchrotron technique
Θεμελιώδης πηγή	Harrick, N. J. (1960). Study of physics of internal reflection from metals. Journal of Physics and Chemistry of Solids, 13(2), 143-155.	Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207.
Εναλλακτικές ονομασίες	ATR-IR, attenuated total reflectance, FTIR spectroscopy	EXAFS spectroscopy, X-ray absorption spectroscopy
Συναφείς	3	3
Σύνοψη	Attenuated Total Reflectance (ATR) Fourier Transform Infrared (FTIR) spectroscopy is a variant of conventional FTIR that measures infrared absorption through evanescent-wave interrogation of samples in direct contact with a high-refractive-index crystal. Developed by Harrick and Fahrenfort in the 1960s, ATR-FTIR is now the dominant form of FTIR spectroscopy, enabling rapid, non-destructive characterization of organic compounds, polymers, coatings, and biological materials without extensive sample preparation.	Extended X-ray Absorption Fine Structure (EXAFS) is a synchrotron-based X-ray spectroscopy technique that measures the local geometric and electronic structure around a specific atom in any material, crystal or amorphous. Discovered by Sayers, Stern, and Lytle in 1971, EXAFS reveals interatomic distances, coordination numbers, and disorder in the atomic environment by analyzing oscillations in the X-ray absorption spectrum above an absorption edge.